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The Determination of Thermal Annealing Effect on the DOS Profile of a-Si:H Film
Thermal Annealing Effect DOS Profile a-Si:H Film
2010/4/19
In this study the aim was to investigate the effect of thermal annealing on the density of states (DOS) of hydrogenated amorphous silicon (a-Si:H) by means of a Schottky structure. In order to realize...