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Identification of pore size in porous SiO2 thin film by positron annihilation
Al-Si thin film porous SiO2 thin film positron annihilation
2009/8/14
Positron annihilation lifetime and Doppler broadening of annihilation line techniques have been used to obtain information about the small pore structure and size of porous SiO2 thin film produced by ...
Photoelectrochemical Investigations on HgxCd1-xSe Thin Film Electrode/Electrolyte System
MCS P-V cells efficiency and fill factor
2010/4/9
Thin film electrodes of HgxCd1-xSe (0 \le x \le 0.2) were prepared in an aqueous alkaline medium (pH \cong 11) on highly conducting stainless steel substrates by chemical bath technique. Use of these ...