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This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
2017SPIE光学计量建模会议(2017 Conference on Modeling Aspects in Optical Metrology)。
Take this opportunity to share your research at SPIE Optical Metrology 2017. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical...
New research in optical measurement technologies enabling applications in industry, research modelling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical M...
Emerging possibilities of using ultrashort pulse lasers as a new light source for advanced optical metrology are addressed in comparison to traditional sources such as CW lasers and white light. Empha...

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