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Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
In this study, a new method is presented, based on genetic algorithms for determining object parameters such as radii and/or attenuation coefficients with some assumptions and estimating a cross-secti...
05 February 2007,A pioneering technique which for the first time allows simultaneous detection of both the spectral and spatial variation of an X-ray beam has been developed by researchers at the Univ...
X-ray reflection was performed on Al2O3 thin films obtained by dc magnetron sputtering of aluminium in an argon/oxygen atmosphere. Two kind of films (amorphous and γ-Al2O3) were deposited on polished ...

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