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A Novel Methodology for Testing Hardware Security and Trust Exploiting On-Chip Power Noise Measurements (Extended Version)
security trust standardised side-channel measurement
2016/5/30
Testing of electronic components is indispensable to minimize malfunction
and failure of complex electronic systems. Currently, functionality and performance of
these electronic components are the m...
Study of Thick Film Resistors By 1/f Noise Measurements
Thick Film Resistors 1/f Noise Measurements
2010/12/21
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.