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Capacitance-voltage profiling techniques for characterization of semiconductor materials and devices
Capacitance-voltage profiling techniques characterization of semiconductor materials devices
2010/11/23
This work re-defines the well-known C-V (capacitance-voltage)measurement technique, in the view of a new physics formula,discovered in 2006 [1].
Profiling of Lithium and Potassium into Silicon
Semiconductor Diffusion Sheet resistance Surface concentration
2010/4/9
The profiling of Lithium and Potassium into Silicon doped by electro deposition from molten salts (LiBr, KI) has been studied for various time periods and deposition currents. For the samples studied,...