搜索结果: 1-1 共查到“凝聚态物理学 Depth Profile”相关记录1条 . 查询时间(0.093 秒)
Phase Identification and AES Depth Profile Analysis of Cu(In,Ga)Se2 Thin Films
CIGS Solar cells XRD AES
2010/9/29
This work presents results related with phase identification and study of the homogeneity in the chemical composition of Cu(In,Ga)Se2 (CIGS) thin films grown by a chemical reaction of the precursor sp...