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Analytical Electron Microscopy in Clays and Other Phyllosilicates: Loss of Elements from a 90-nm Stationary Beam of 300-keV Electrons
Analytical Electron Microscopy Clay Minerals Diffusion Element Loss Low Temperature Phyllosilicates Sputtering Stationary Beam
2011/12/8
Abstract: Diffusion of alkali and low-atomic-number elements during the microbeam analysis of some silicates by analytical electron microscopy (AEM) has been known for some time. Our repeated analyses...