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Rao statistical test for radar targets based on SG-Alpha stable distribution
radar target detection Rao test subGaussian-Alpha stable distribution non-Gaussian clutter
2012/3/22
In relative non-Gaussian clutter backgrounds, one of the difficulties on radar target detection is to establish a likelihood ratio test model. Based on the SG-Alpha（subGaussian-Alpha）stable distributi...
Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques
Control Structures Design for Manufacturability Electromigration Manufacturing Yield Photolithography Reliability
2014/11/7
Much of today's high performance computing engines and hand-held mobile devices are products of aggressive CMOS scaling. Technology scaling in semiconductor industry is mainly driven by corresponding ...
Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors
Hot-carrier P-MOS transistor lifetime prediction
2009/7/28
Along with advances in microelectronics, and computer and space technologies, device dimensions are becoming smaller; as a result, hot-carrier effect, lifetime prediction, and reliability become more ...
A New Statistical Method for Maximum Power Estimation in CMOS VLSI Circuits
Maximum power reliability CMOS VLSI circuits statistics extremes
2010/12/8
A method for maximum power estimation in CMOS VLSI circuits is proposed. The method is based on extreme value theory and allows for the calculation of the upper end point of the probability distributi...
A Method for the Statistical Evaluation of Crosstalk Effect Between Three Parallel Conductors
Crosstalk statistical model MTL method
2010/12/9
There are several cases at which, in order to evaluate the crosstalk effect among transmission lines carrying useful signals, there is a need for probabilistic approach. This paper considers the probl...
Comparative Study of Statistical Distributions in Electromigration-Induced Failures of Al/Cu Thin-Film Interconnects
Statistical Distributions Electromigration-Induced Failures Al/Cu Thin-Film Interconnects
2010/12/15
In electromigration failure studies, it is in general assumed that electromigration-induced failures may be adequately modelled by a log-normal distribution. Further to this, it has been argued that a...